Progress Report

Progress Report for Ist Semester of Session 2009-2010 A) Course work done during second semester(2009-2010)

Course Characterization of Materials Communication skills

Course code

Result

PHL707 HUL810

ANP

SGPA- 9.00 CGPA- 9.25

B) Research work carried out during this semester 1. Learnt operation of Ion beam sputtering system (NORDIKO 3450) and pulse DC sputtering system. 2. Thin films of CoFeB and Fe having different thicknesses were deposited on silicon substrate using ion beam RF sputtering. Phase and thickness of these thin films were determined using XRD & XRR, respectively. Magnetic properties were studied using MOKE. 3. In order to understand the phenomenon of exchange biasing, thin films of Si/IrMn(AFM)/CoFeB(FM) were deposited for different thicknesses of FM layer. M-H loops were recorded for as-deposited as well as magnetic annealed films. 4. For magnetic annealing, a new magnetic annealing system was successfully designed. Post deposition vacuum annealing (5×10-5 torr) of FM-AFM bilayers was carried out at 250oC in an applied magnetic field of 500 mT for 30 min. SQUID and MOKE measurements of these annealed bilayers have also been performed. 5. Extensive literature survey in the related research area was also carried out.

Himanshu Fulara 2008PHZ8366

Thesis Supervisors:

Prof S.C.Kashyap

& Dr. Sujeet Chaudhary