An Adaptive Sleep Transistor Biasing Scheme for Low Leakage SRAM Afshin Nourivand, Chunyan Wang, and M. Omair Ahmad Department of Electrical and Computer Engineering Concordia University 1455 de Maisonneuve Blvd. West, Montréal Québec, Canada H3G 1M8
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Outline Problem addressed: leakage currents in SRAM cells non-uniform device characteristics static noise margin reduction Approach to reducing the leakage currents using sleep transistor adaptive virtual ground voltage
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Leakage currents in SRAM cells BL
BL 0
WL
subthreshold current 1 MaL
MpL 1 Q
MpR 0 Q
MnL
MnR
1 MaR
reverse current gate current
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Leakage Current Reduction (1) by means of a sleep transistor
BL
BL 0
1 MaL
WL
MpL 1 Q
MpR 0 Q
MnL
MnR
1
V sourse : Virtual ground higher V sourse lower leakage
MaR
Static noise margin?
Vsource
Sleep#
Msl
A. Agarwal, H. Li, and K. Roy, A single-Vt low-leakage gated-ground cache for deep submicron, IEEE Journal of Solid State Circuits, vol. 38, no. 2, pp. 319 328, Feb. 2003.
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Leakage Current Reduction (2) by means of a sleep transistor
leakage current vs. SMN “optimal” virtual ground voltage non-uniform cell characteristics non-uniform optimal virtual ground voltage individual calibration in an automatic manner 5 of 8
Leakage Current Reduction by means of an adaptive virtual ground voltage BL
BL 0
1 MaL
WL
MpL 1 Q
MpR 0 Q
MnL
MnR
V sourse : Virtual ground adjusted to its maximum by means of a feedback process 1 MaR
Maximum V source of a cell/block adapted to its characteristics
Vsource
Vx
Sleep#
Msl
V y : active when V source reaches its maximum V x : incrementing V source incrementing if V y is not active 6 of 8
Leakage Current Reduction Address 4 cells
Adaptive Reference Voltage Generation
by means of an adaptive virtual ground voltage
BIST SRAM Block
Data Test
Pass/Fail
Source Line
Cal.
Controller From Inc/Dec Decoder Programmable Vref-opt Voltage Generator 0 Vref
Sleep# + -
P1
Msl
N1 Sleep#_Bias
Dynamic Sleep Transistor Biasing
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Conclusion Low-power in SRAM by leakage power reduction
• based on the sleeping-transistor method • automatic set-up of the virtual ground voltage of a cell/block by a feedback process
• dispersion of device characteristics taken into account
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