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PD -94000

IRF7328 HEXFET® Power MOSFET ● ● ● ●

Trench Technology Ultra Low On-Resistance Dual P-Channel MOSFET Available in Tape & Reel

VDSS -30V

RDS(on) max

ID

21mΩ@VGS = -10V

-8.0A

32mΩ@VGS = -4.5V

-6.8A

Description New trench HEXFET® Power MOSFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in battery and load management applications.

S1 G1 S2 G2

1

8

D1

2

7

D1

3

6

4

5

D2 D2

SO-8

T o p V ie w

Absolute Maximum Ratings Parameter VDS ID @ TA = 25°C ID @ TA = 70°C IDM PD @TA = 25°C PD @TA = 70°C VGS TJ , TSTG

Drain-Source Voltage Continuous Drain Current, VGS @ -10V Continuous Drain Current, VGS @ -10V Pulsed Drain Current Maximum Power Dissipationƒ Maximum Power Dissipationƒ Linear Derating Factor Gate-to-Source Voltage Junction and Storage Temperature Range

Max.

Units

-30 -8.0 -6.4 -32 2.0 1.3 16 ± 20 -55 to + 150

V

W W mW/°C V °C

Max.

Units

62.5

°C/W

A

Thermal Resistance Parameter RθJA

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Maximum Junction-to-Ambient ƒ

1 10/04/00

IRF7328 Electrical Characteristics @ TJ = 25°C (unless otherwise specified) ∆V(BR)DSS/∆TJ

Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient

RDS(on)

Static Drain-to-Source On-Resistance

VGS(th) gfs

Gate Threshold Voltage Forward Transconductance

IDSS

Drain-to-Source Leakage Current

V(BR)DSS

IGSS Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss

Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance

Min. -30 ––– ––– ––– -1.0 12 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– –––

Typ. ––– -0.018 17 26.8 ––– ––– ––– ––– ––– ––– 52 9.8 8.3 13 15 198 98 2675 409 262

Max. Units Conditions ––– V VGS = 0V, ID = -250µA ––– V/°C Reference to 25°C, ID = -1mA 21 VGS = -10V, ID = -8.0A ‚ mΩ 32 VGS = -4.5V, ID = -6.8A ‚ -2.5 V VDS = VGS, ID = -250µA ––– S VDS = -10V, ID = -8.0A -15 VDS = -24V, VGS = 0V µA -25 VDS = -24V, VGS = 0V, TJ = 70°C -100 VGS = -20V nA 100 VGS = 20V 78 ID = -8.0A ––– nC VDS = -15V ––– VGS = -10V 20 VDD = -15V, VGS = -10.0V 23 ID = -1.0A ns 297 RG = 6.0Ω 147 RD = 15Ω ‚ ––– VGS = 0V ––– pF VDS = -25V ––– ƒ = 1.0MHz

Source-Drain Ratings and Characteristics IS ISM

VSD trr Qrr

Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode)  Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge

Min. Typ. Max. Units –––

–––

-2.0

–––

–––

-32

––– ––– –––

––– 37 36

-1.2 56 54

A V ns nC

Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25°C, IS = -2.0A, VGS = 0V ‚ TJ = 25°C, I F = -2.0A di/dt = -100A/µs ‚

D

S

Notes:

 Repetitive rating; pulse width limited by

ƒ Surface mounted on FR-4 board, t ≤ 10sec.

max. junction temperature.

‚ Pulse width ≤ 400µs; duty cycle ≤ 2%.

2

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IRF7328 100

VGS -10.0V -5.0V -4.5V -4.0V -3.5V -3.3V -3.0V BOTTOM -2.7V

100

VGS -10.0V -5.0V -4.5V -4.0V -3.5V -3.3V -3.0V BOTTOM -2.7V

10

1

-2.7V

TOP

-ID, Drain-to-Source Current (A)

-ID, Drain-to-Source Current (A)

TOP

10

-2.7V 1

20µs PULSE WIDTH Tj = 150°C

20µs PULSE WIDTH Tj = 25°C 0.1

0.1 0.1

1

10

100

0.1

-VDS, Drain-to-Source Voltage (V)

RDS(on) , Drain-to-Source On Resistance (Normalized)

-I D , Drain-to-Source Current (A)

2.0

TJ = 150 ° C

TJ = 25 ° C 1

V DS = -15V 20µs PULSE WIDTH 3.0

4.0

5.0

-VGS , Gate-to-Source Voltage (V)

Fig 3. Typical Transfer Characteristics

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100

Fig 2. Typical Output Characteristics

100

0.1 2.0

10

-VDS, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics

10

1

6.0

ID = -8.0A

1.5

1.0

0.5

0.0 -60 -40 -20

VGS = -10V 0

20

40

60

80 100 120 140 160

TJ , Junction Temperature ( ° C)

Fig 4. Normalized On-Resistance Vs. Temperature

3

IRF7328 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd

3000

Ciss

2000

1000

Coss Crss

14

-VGS , Gate-to-Source Voltage (V)

C, Capacitance (pF)

4000

10

V DS =-24V V DS =-15V

12 10 8 6 4 2

0 1

ID = -8A

0

100

0

10

-VDS , Drain-to-Source Voltage (V)

40

50

60

1000

100

OPERATION IN THIS AREA LIMITED BY RDS(on) TJ = 150 ° C

-IID , Drain Current (A)

-ISD , Reverse Drain Current (A)

30

Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage

Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage

10

100

TJ = 25 ° C

1

0.1 0.2

0.4

0.6

0.8

1.0

1.2

1.4

Fig 7. Typical Source-Drain Diode Forward Voltage

100us 10 1ms

TC = 25 °C TJ = 150 °C Single Pulse

V GS = 0 V

-VSD ,Source-to-Drain Voltage (V)

4

20

QG , Total Gate Charge (nC)

1.6

1 0.1

10ms 1

10

100

-VDS , Drain-to-Source Voltage (V)

Fig 8. Maximum Safe Operating Area

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IRF7328 10.0

VDS VGS

-ID , Drain Current (A)

8.0

RD

D.U.T.

RG

+

VDD

6.0

VGS Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %

4.0

Fig 10a. Switching Time Test Circuit 2.0 td(on)

tr

t d(off)

tf

VGS 10%

0.0 25

50

75

100

125

150

TC , Case Temperature ( ° C) 90%

Fig 9. Maximum Drain Current Vs. Case Temperature

VDS

Fig 10b. Switching Time Waveforms

Thermal Response (Z thJA )

1000

100 D = 0.50 0.20 10

0.10 PDM

0.05 0.02 0.01

1

t1 t2 SINGLE PULSE (THERMAL RESPONSE)

0.1 0.0001

0.001

0.01

Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x ZthJA + TA 0.1

1

10

100

1000

t1 , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient

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5

0.060

RDS ( on ) , Drain-to-Source On Resistance (Ω )

( RDS(on), Drain-to -Source On Resistance Ω)

IRF7328

0.050

0.040

ID = -8.0A

0.030

0.020

0.010

0.000 3.0

4.0

5.0

6.0

7.0

8.0

9.0

10.0

0.100

0.075

0.050 VGS = -4.5V VGS = -10V

0.025

0.000 0

10

20

-VGS, Gate -to -Source Voltage (V)

Fig 12. Typical On-Resistance Vs. Gate Voltage

30

40

50

60

70

-ID , Drain Current ( A )

Fig 13. Typical On-Resistance Vs. Drain Current

Current Regulator Same Type as D.U.T.

50KΩ

QG

12V

.2µF .3µF

10 V

D.U.T.

QGS

+VDS

QGD VGS -3mA

VG

IG

ID

Current Sampling Resistors

Charge

Fig 14a. Basic Gate Charge Waveform

6

Fig 14b. Gate Charge Test Circuit

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IRF7328

SO-8 Package Details D IM

D -B -

5

8 E -A -

1

7

2

5

A 6

3

e 6X

5 H 0.2 5 (.0 10 )

4

M

A M

θ

e1

K x 45 °

-C-

0 .10 (.00 4) B 8X 0 .25 (.01 0)

A1

L 8X

6

C 8X

M C A S B S

N O TE S : 1 . D IM EN SIO N IN G AN D TO L ER A NC IN G P ER AN S I Y1 4.5 M -198 2. 2 . C O N TRO L LIN G D IM EN SIO N : IN C H . 3 . D IM EN SIO N S A RE SH O W N IN M ILLIM E TE R S (IN C HE S). 4 . O U TLIN E CO N F O RM S TO JED E C O U TLINE M S -0 12 AA . 5 D IM E NS IO N D O ES N O T IN C LU D E M O LD PR O TR US IO N S M O LD P R O TR U SIO NS N O T TO EXCE ED 0 .2 5 (.00 6). 6 D IM E NS IO N S IS TH E LE N G TH O F L EA D FO R SO L DE R IN G TO A SU B STRA TE..

M IN

M AX

.0532

.0688

1 .35

1 .75

.0040

.0098

0 .10

0 .25

B

.014

.018

0 .36

0 .46

C

.0 075

.0 098

0 .19

0.25

D

.1 89

.1 96

4 .80

4.98

E

.150

.157

3 .81

3 .99

e1

A

M IL LIM E T E R S

MAX

A1

e

θ

IN C H E S M IN

.050 B A S IC

1.2 7 B A S IC

.025 B A S IC

0.6 35 B A S IC

H

.2 284

.2 440

K

.011

.019

0 .28

5 .80

0 .48

6.20

L

0 .16

.050

0 .41

1.27

θ









R E CO M M E ND E D F O O TP R IN T 0 .72 (.02 8 ) 8X

6 .46 ( .25 5 )

1 .78 (.07 0) 8X

1.27 ( .0 50 ) 3X

Part Marking

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7

IRF7328 Tape and Reel T E R M IN A L N U M B E R 1

1 2 .3 ( .4 8 4 ) 1 1 .7 ( .4 6 1 )

8 .1 ( .3 1 8 ) 7 .9 ( .3 1 2 )

F E E D D IR E C T IO N

N O TES: 1 . C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R . 2 . A L L D IM E N S IO N S A R E S H O W N IN M IL L IM E T E R S (IN C H E S ). 3 . O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 .

3 3 0 .0 0 (1 2 .9 9 2 ) MAX.

1 4 .4 0 ( .5 66 ) 1 2 .4 0 ( .4 88 ) N O TE S : 1. C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R . 2. O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 .

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936 Data and specifications subject to change without notice. 10/00

8

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